在嵌入式linux開發過程中，經常會使用到nor flash，nand flash等存放裝置，由於flash的晶片型號和介面類別型較多，性能不一，我們需要對系統中使用的flash性能進行分析，並對設備工作的穩定性進行測試。
flash設備在嵌入式系統中，會被驅動為MTD分區，在linux kernel中，提供了針對MTD的測試模組，方面開發人員對flash的功能，性能，穩定性等進行測試。
使用make ARCH=arm menuconfig打開kernel配置介面，配置 "Device
Drivers" -> "Memory Technology Device (MTD) support" ->
"MTD tests support"，該選項只可以配置為按模組編譯，保存配置後退出。
使用make ARCH=arm
CROSS_COMPILE=arm-linux-gnueabihf- modules編譯代碼，生成測試工具模組，存儲在目錄drivers/mtd/tests中，包括以下內容：
mtd_nandecctest.ko：nand flash的ECC校驗測試
mtd_pagetest.ko：nand flash的page讀寫測試
mtd_speedtest.ko：MTD分區的讀寫速度測試
mtd_subpagetest.ko：nand flash的sub-page介面測試
mtd_oobtest.ko：nand falsh的OOB區域讀寫測試
mtd_readtest.ko：讀取整個MTD分區
mtd_stresstest.ko：隨機讀寫，擦除操作測試
mtd_torturetest.ko：該功能可用於做穩定性或者壽命測試，隨機操作直到發生錯誤
在即時ko檔進行測試時，可以通過dev=n指定要測試的MTD分區，示例如下：
insmod mtd_stresstest.ko dev=9 count=1000
[ 3289.273771]
=================================================
[ 3289.279826] mtd_stresstest: MTD device: 9
[ 3289.284079] mtd_stresstest: MTD device size
268435456, eraseblock size 131072, page size 2048, count of eraseblocks 2048,
pages per eraseblock 64, OOB size 64
[ 3289.303250] mtd_stresstest: scanning for bad
eraseblocks
[ 3289.420267] mtd_stresstest: scanned 2048
eraseblocks, 0 are bad
[ 3289.426534] mtd_stresstest: doing operations
[ 3289.431031] mtd_stresstest: 0 operations done
[ 3339.606972] mtd_stresstest: finished, 1000
operations done
[ 3339.612992]
=================================================
當mtd_stresstest測試發生操作錯誤時，會退出並答應錯誤資訊，示例如下：
[root@AT8XXX ~]# dmesg |grep mtd_stresstest
[591404.676252] mtd_stresstest: MTD device: 9
[591404.680577] mtd_stresstest: MTD device size
268435456, eraseblock size 131072, page size 2048, count of eraseblocks 2048,
pages per eraseblock 64, OOB size 64
[591404.699798] mtd_stresstest: scanning for bad
eraseblocks
[591404.715081] mtd_stresstest: block 78 is bad
[591404.723850] mtd_stresstest: block 159 is bad
[591404.812382] mtd_stresstest: block 1752 is bad
[591404.832925] mtd_stresstest: scanned 2048
eraseblocks, 3 are bad
[591404.839259] mtd_stresstest: doing operations
[591404.843859] mtd_stresstest: 0 operations done
[591459.037353] mtd_stresstest: 1024 operations done
[591510.529876] mtd_stresstest: 2048 operations done
[594847.430017] mtd_stresstest: error: write failed
at 0xf964000
[594847.436350] mtd_stresstest: error -5 occurred
Source https://www.crifan.com/the_new_linux_kernel_of_the_mtd_test_into_the_old_kernel_in/
將新的Linux kernel中的MTD test加入到舊的kernel中
Linux Kernel自從2.6.29之後，就加入了MTD test模組，即幾個測試模組，用於測試你的mtd的特性。
分別是：
mtd_oobtest.c //測試oob資料讀寫是否正常
mtd_pagetest.c //測試page讀寫
mtd_readtest.c //測試讀功能
mtd_speedtest.c //測試mtd的速度
mtd_stresstest.c //壓力測試
mtd_subpagetest.c //子頁面（如果支援的話，此處我的是MLC，不支援sub page）
mtd_torturetest.c //扭曲測試？ 反正就是對mtd“嚴刑拷打”，看看其能經受多少讀寫，直至掛掉。。，所以，作者說了，除非你知道自己在幹啥，否則不要隨意進行這個測試。
mtd_pagetest.c //測試page讀寫
mtd_readtest.c //測試讀功能
mtd_speedtest.c //測試mtd的速度
mtd_stresstest.c //壓力測試
mtd_subpagetest.c //子頁面（如果支援的話，此處我的是MLC，不支援sub page）
mtd_torturetest.c //扭曲測試？ 反正就是對mtd“嚴刑拷打”，看看其能經受多少讀寫，直至掛掉。。，所以，作者說了，除非你知道自己在幹啥，否則不要隨意進行這個測試。
其中，最有用的就是speed test了，方便了開發者用來測試你的mtd（我的此處是nand flash）的讀/寫/擦除塊的速度。
我當前用的Linux kernel是2.6.28.4，沒有加入MTD test，所以自己加入：
（1）下載mtd tests源碼，並加入到自己的內核中，編譯成.ko模組用於後期動態載入：
我這裡是從最新內核linux-2.6.32.8：
中的/drivers/mtd/test裡面抽取的，然後放到自己的kernel源碼中：
/drivers/mtd/test，再把
config MTD_TESTS
tristate "MTD tests support"
depends on m
help
This option includes various MTD tests into compilation. The tests
should normally be compiled as kernel modules. The modules perform
various checks and verifications when loaded.
加入到Kconfig中，把
tristate "MTD tests support"
depends on m
help
This option includes various MTD tests into compilation. The tests
should normally be compiled as kernel modules. The modules perform
various checks and verifications when loaded.
加入到Kconfig中，把
obj-y += tests/
加入到Makefile中。然後make ARCH=arm menuconfig，去把mtd test選上：
Device Drivers —>
<*> Memory Technology Device (MTD) support —>
再編譯一下：
make ARCH=arm; make ARCH=arm uImage
就可以生成對應的.ko模組檔了。
（2）.如何使用MTD test：
進入Kernel後，使用也很簡單
比如：insmod mtd_speedtest.ko dev=3
注:此處的dev指的是你mtd設備number，我這裡的：
# cat /proc/mtd
dev: size erasesize name
mtd0: 00100000 00080000 "U-Boot"
mtd1: 00800000 00080000 "Kernel"
mtd2: 0c800000 00080000 "Root filesystem"
mtd3: 04000000 00080000 "Temp"
mtd4: 69000000 00080000 "Data"
dev: size erasesize name
mtd0: 00100000 00080000 "U-Boot"
mtd1: 00800000 00080000 "Kernel"
mtd2: 0c800000 00080000 "Root filesystem"
mtd3: 04000000 00080000 "Temp"
mtd4: 69000000 00080000 "Data"
dev=3，就是mtd3，就是上面的Temp分區。
（3）舉例如何使用：
最後列舉一些測試結果如下：
# ls
mtd_oobtest.ko mtd_readtest.ko mtd_subpagetest.ko
mtd_speedtest.ko mtd_torturetest.ko
mtd_pagetest.ko mtd_stresstest.ko
# insmod mtd_speedtest.ko dev=3
mtd_oobtest.ko mtd_readtest.ko mtd_subpagetest.ko
mtd_speedtest.ko mtd_torturetest.ko
mtd_pagetest.ko mtd_stresstest.ko
# insmod mtd_speedtest.ko dev=3
=================================================
mtd_speedtest: MTD device: 3
mtd_speedtest: MTD device size 67108864, eraseblock size 524288, page size 4096, count of eraseblocks 128, pages per eraseblock 128, OOB size 128
mtd_speedtest: scanning for bad eraseblocks
mtd_speedtest: scanned 128 eraseblocks, 0 are bad
mtd_speedtest: testing eraseblock write speed
mtd_speedtest: eraseblock write speed is 1754 KiB/s
mtd_speedtest: testing eraseblock read speed
mtd_speedtest: eraseblock read speed is 2443 KiB/s
mtd_speedtest: testing page write speed
mtd_speedtest: page write speed is 1748 KiB/s
mtd_speedtest: testing page read speed
mtd_speedtest: page read speed is 2439 KiB/s
mtd_speedtest: testing 2 page write speed
mtd_speedtest: 2 page write speed is 1751 KiB/s
mtd_speedtest: testing 2 page read speed
mtd_speedtest: 2 page read speed is 2440 KiB/s
mtd_speedtest: Testing erase speed
mtd_speedtest: erase speed is 439838 KiB/s
mtd_speedtest: finished
=================================================
mtd_speedtest: MTD device: 3
mtd_speedtest: MTD device size 67108864, eraseblock size 524288, page size 4096, count of eraseblocks 128, pages per eraseblock 128, OOB size 128
mtd_speedtest: scanning for bad eraseblocks
mtd_speedtest: scanned 128 eraseblocks, 0 are bad
mtd_speedtest: testing eraseblock write speed
mtd_speedtest: eraseblock write speed is 1754 KiB/s
mtd_speedtest: testing eraseblock read speed
mtd_speedtest: eraseblock read speed is 2443 KiB/s
mtd_speedtest: testing page write speed
mtd_speedtest: page write speed is 1748 KiB/s
mtd_speedtest: testing page read speed
mtd_speedtest: page read speed is 2439 KiB/s
mtd_speedtest: testing 2 page write speed
mtd_speedtest: 2 page write speed is 1751 KiB/s
mtd_speedtest: testing 2 page read speed
mtd_speedtest: 2 page read speed is 2440 KiB/s
mtd_speedtest: Testing erase speed
mtd_speedtest: erase speed is 439838 KiB/s
mtd_speedtest: finished
=================================================
# insmod mtd_oobtest.ko dev=3
=================================================
mtd_oobtest: MTD device: 3
mtd_oobtest: MTD device size 67108864, eraseblock size 524288, page size 4096, count of eraseblocks 128, pages per eraseblock 128, OOB size 128
mtd_oobtest: scanning for bad eraseblocks
mtd_oobtest: scanned 128 eraseblocks, 0 are bad
mtd_oobtest: test 1 of 5
mtd_oobtest: erasing whole device
mtd_oobtest: erased 128 eraseblocks
mtd_oobtest: writing OOBs of whole device
mtd_oobtest: written up to eraseblock 0
mtd_oobtest: written 128 eraseblocks
mtd_oobtest: verifying all eraseblocks
mtd_oobtest: verified up to eraseblock 0
mtd_oobtest: verified 128 eraseblocks
mtd_oobtest: test 2 of 5
mtd_oobtest: erasing whole device
mtd_oobtest: erased 128 eraseblocks
mtd_oobtest: writing OOBs of whole device
mtd_oobtest: written up to eraseblock 0
mtd_oobtest: written 128 eraseblocks
mtd_oobtest: verifying all eraseblocks
mtd_oobtest: verified up to eraseblock 0
mtd_oobtest: verified 128 eraseblocks
mtd_oobtest: test 3 of 5
mtd_oobtest: erasing whole device
mtd_oobtest: erased 128 eraseblocks
mtd_oobtest: writing OOBs of whole device
mtd_oobtest: written up to eraseblock 0
mtd_oobtest: written 128 eraseblocks
mtd_oobtest: verifying all eraseblocks
mtd_oobtest: verified up to eraseblock 0
mtd_oobtest: verified 128 eraseblocks
mtd_oobtest: test 4 of 5
mtd_oobtest: erasing whole device
mtd_oobtest: erased 128 eraseblocks
mtd_oobtest: attempting to start write past end of OOB
mtd_oobtest: an error is expected…
mtd_oobtest: error occurred as expected
mtd_oobtest: attempting to start read past end of OOB
mtd_oobtest: an error is expected…
mtd_oobtest: error occurred as expected
mtd_oobtest: attempting to write past end of device
mtd_oobtest: an error is expected…
mtd_oobtest: error occurred as expected
mtd_oobtest: attempting to read past end of device
mtd_oobtest: an error is expected…
mtd_oobtest: error: read past end of device
mtd_oobtest: attempting to write past end of device
mtd_oobtest: an error is expected…
mtd_oobtest: error occurred as expected
mtd_oobtest: attempting to read past end of device
mtd_oobtest: an error is expected…
mtd_oobtest: error: read past end of device
mtd_oobtest: test 5 of 5
mtd_oobtest: erasing whole device
mtd_oobtest: erased 128 eraseblocks
mtd_oobtest: writing OOBs of whole device
mtd_oobtest: written up to eraseblock 0
mtd_oobtest: written up to eraseblock 0
mtd_oobtest: written 127 eraseblocks
mtd_oobtest: verifying all eraseblocks
mtd_oobtest: verified up to eraseblock 0
mtd_oobtest: verified 127 eraseblocks
mtd_oobtest: finished with 2 errors
=================================================
mtd_oobtest: MTD device: 3
mtd_oobtest: MTD device size 67108864, eraseblock size 524288, page size 4096, count of eraseblocks 128, pages per eraseblock 128, OOB size 128
mtd_oobtest: scanning for bad eraseblocks
mtd_oobtest: scanned 128 eraseblocks, 0 are bad
mtd_oobtest: test 1 of 5
mtd_oobtest: erasing whole device
mtd_oobtest: erased 128 eraseblocks
mtd_oobtest: writing OOBs of whole device
mtd_oobtest: written up to eraseblock 0
mtd_oobtest: written 128 eraseblocks
mtd_oobtest: verifying all eraseblocks
mtd_oobtest: verified up to eraseblock 0
mtd_oobtest: verified 128 eraseblocks
mtd_oobtest: test 2 of 5
mtd_oobtest: erasing whole device
mtd_oobtest: erased 128 eraseblocks
mtd_oobtest: writing OOBs of whole device
mtd_oobtest: written up to eraseblock 0
mtd_oobtest: written 128 eraseblocks
mtd_oobtest: verifying all eraseblocks
mtd_oobtest: verified up to eraseblock 0
mtd_oobtest: verified 128 eraseblocks
mtd_oobtest: test 3 of 5
mtd_oobtest: erasing whole device
mtd_oobtest: erased 128 eraseblocks
mtd_oobtest: writing OOBs of whole device
mtd_oobtest: written up to eraseblock 0
mtd_oobtest: written 128 eraseblocks
mtd_oobtest: verifying all eraseblocks
mtd_oobtest: verified up to eraseblock 0
mtd_oobtest: verified 128 eraseblocks
mtd_oobtest: test 4 of 5
mtd_oobtest: erasing whole device
mtd_oobtest: erased 128 eraseblocks
mtd_oobtest: attempting to start write past end of OOB
mtd_oobtest: an error is expected…
mtd_oobtest: error occurred as expected
mtd_oobtest: attempting to start read past end of OOB
mtd_oobtest: an error is expected…
mtd_oobtest: error occurred as expected
mtd_oobtest: attempting to write past end of device
mtd_oobtest: an error is expected…
mtd_oobtest: error occurred as expected
mtd_oobtest: attempting to read past end of device
mtd_oobtest: an error is expected…
mtd_oobtest: error: read past end of device
mtd_oobtest: attempting to write past end of device
mtd_oobtest: an error is expected…
mtd_oobtest: error occurred as expected
mtd_oobtest: attempting to read past end of device
mtd_oobtest: an error is expected…
mtd_oobtest: error: read past end of device
mtd_oobtest: test 5 of 5
mtd_oobtest: erasing whole device
mtd_oobtest: erased 128 eraseblocks
mtd_oobtest: writing OOBs of whole device
mtd_oobtest: written up to eraseblock 0
mtd_oobtest: written up to eraseblock 0
mtd_oobtest: written 127 eraseblocks
mtd_oobtest: verifying all eraseblocks
mtd_oobtest: verified up to eraseblock 0
mtd_oobtest: verified 127 eraseblocks
mtd_oobtest: finished with 2 errors
=================================================
［附錄］
http://www.linux-mtd.infradead.org/doc/general.html
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